Dielectric absorption — the series
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The capacitor that remembers
Charge a capacitor, short it for ten seconds, open it, and it climbs back to a fifth of a per cent of where it was. Nothing leaked and nothing was gained: some of the dielectric had not finished discharging. The same defect measured as an admittance says the part is 0.593 per cent more capacitance at a tenth of a millihertz than at a kilohertz, and measured in a sample-and-hold it says a millisecond of hold costs a hundred parts per million — thirteen bits, on a part specified at nothing.
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Ten seconds, and fifteen minutes
A data sheet's dielectric absorption is quoted as a property of the part. It is not: the same modelled capacitor reads 0.4050 per cent with a tenth-of-a-second short and 0.0305 per cent with a thousand-second one, and 0.0047 against 0.2948 depending on when the reading is taken. Seventeen marched tests collapse onto one line — the recovery is 1.0288 parts per thousand for every decade between the two durations — and four dielectrics the specified test declares identical read a factor of 3.31 apart one decade away from it.
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The sample before the sample
A sample-and-hold whose capacitor has 0.2 per cent of dielectric absorption reads a 10 V step 109 parts per million wrong on the first sample after it, 46.7 on the tenth, and 4.5 on the hundredth, because every earlier sample is still in the dielectric. That error has been described as distortion, since it grows with the signal. It is not. The state is linear and one period is a single matrix, so the reading is a fixed weighted sum of earlier samples, a filter with a very long tail: a sine reads 28.1 parts per million low and its largest harmonic is 1.5 × 10⁻¹² of the fundamental. A filter can be undone. Subtracting fifty earlier samples takes a stepped signal from 51.6 parts per million to 1.61, and with the absorption known to 20 per cent it stops at 5.47.