Dielectric absorption — the series
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The capacitor that remembers
Charge a capacitor, short it for ten seconds, open it, and it climbs back to a fifth of a per cent of where it was. Nothing leaked and nothing was gained: some of the dielectric had not finished discharging. The same defect measured as an admittance says the part is 0.593 per cent more capacitance at a tenth of a millihertz than at a kilohertz, and measured in a sample-and-hold it says a millisecond of hold costs a hundred parts per million — thirteen bits, on a part specified at nothing.
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Ten seconds, and fifteen minutes
A data sheet's dielectric absorption is quoted as a property of the part. It is not: the same modelled capacitor reads 0.4050 per cent with a tenth-of-a-second short and 0.0305 per cent with a thousand-second one, and 0.0047 against 0.2948 depending on when the reading is taken. Seventeen marched tests collapse onto one line — the recovery is 1.0288 parts per thousand for every decade between the two durations — and four dielectrics the specified test declares identical read a factor of 3.31 apart one decade away from it.