Relaxation time — where it appears
Named by 2 essays across one field — each of them below, with the objects they name alongside it.
The capacitor that remembers
Charge a capacitor, short it for ten seconds, open it, and it climbs back to a fifth of a per cent of where it was. Nothing leaked and nothing was gained: some of the dielectric had not finished discharging. The same defect measured as an admittance says the part is 0.593 per cent more capacitance at a tenth of a millihertz than at a kilohertz, and measured in a sample-and-hold it says a millisecond of hold costs a hundred parts per million — thirteen bits, on a part specified at nothing.
Ten seconds, and fifteen minutes
A data sheet's dielectric absorption is quoted as a property of the part. It is not: the same modelled capacitor reads 0.4050 per cent with a tenth-of-a-second short and 0.0305 per cent with a thousand-second one, and 0.0047 against 0.2948 depending on when the reading is taken. Seventeen marched tests collapse onto one line — the recovery is 1.0288 parts per thousand for every decade between the two durations — and four dielectrics the specified test declares identical read a factor of 3.31 apart one decade away from it.
Named alongside it
The objects these essays reach for when they reach for this one.
Dielectric absorptionMarchingModel rangeClosed formComponent toleranceLoss tangentMeasurement conditionReal capacitorSample-and-holdSettling timeTemperature coefficientVerification